Whether you need surface topography, cross-sectional analysis, or general imaging, we’ll work with your team to find the most effective imaging solution.

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• SEM: Scanning Electron Microscopy offers unparalleled high-resolution imaging of your sample’s surface features. Whether you need to analyze microstructures, study surface topography, or investigate potential defects, our SEM services provide the clarity and detail you need to make informed decisions.
   

• EDS/EDX: Energy dispersive x-ray spectroscopy gives you crucial insights into the material composition of your product, allowing you to reliably test for elemental components.
   

• FIB: Focused Ion Beam is an extremely useful tool with applications ranging from cross-sectional imaging to manual device modification. We’ll work with you to determine how FIB can be leveraged for your application.

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• AFM: Our scanning probe microscopy service helps you gather crucial topographical information, allowing you to precisely determine surface roughness, feature height, and more.​

• Analysis: We can provide sophisticated analysis including porosity, surface roughness, and particle size measurements.

MICRO- AND NANO-SCALE DEVICE PROCESSING

Whether you need something designed and fabricated from the ground up or you’re looking for help on a specific step, we’ve got you covered.

Micro- and Nano-lithography: We’ll help you find the most cost-effective patterning solution for your application depending on your feature size and aspect ratio

Deposition: We specialize in a broad array of deposition technologies including electroplating, CVD, ALD, sputtering, and more.

Etching: Let us help you find the right etching solution by handling selectivity calculations and time considerations, factoring in the chemical composition and nature of your device.